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2014-12
2014-12Edit

    JJoxv5_10Edit section

    Increased undercut boxes, (both to top and to left).

    exp: 30keV (01/12/2014)
    dev: 1', eth:IPA=1:1 for 1', IPA 1'. Looks fine under optical microscope.
    no Ashing
    evapion milling 2x10" 3mA 500V, Al 30nm 0° 1 nm/s, dynamic oxydation 75mb 5 min, Al 0.6 nm 0° 0.1 nm/s (0.74nm at shutter close), dynamic oxydation 75mb  5 min, Al 60 nm +35°.
    Lift-off: PG remover at 70°C for xx hour. No US.
    Probe station:

    4 probes Junction A (=top) Junction B Junction C Junction D (bottom)
    1-2 5-6: 1.0051 (-50) 3-4: 1.0046 (-45) 1-2: 1.0046 (-45) 16-15:1.0045 (-44)
    3-4 7-8: 1.0048 (-47) 9-10: 1.0046 (-45) 11-12: 1.0046 (-45) 14-13: 1.0045 (-44)
    1-3 5-7: 1.0168 (-47) 3-9: 1.0213 (-45) 1-11: 1.0267 (-45) 16-14: 1.0280 (-44)
    1-4 5-8: 1.0167 (-46) 3-10: 1.0213 (-45) 1-12: 1.0267 (-45) 16-13: 1.0280 (-44)
    2-3 6-7: 1.0168 (-47) 4-9: 1.0213 (-45) 2-11: 1.0267 (-45) 15-14: 1.0280 (-44)
    2-4 6-8: 1.0168 (-47) 4-10: 1.0213 (-45) 2-12: 1.0267 (-45) 15-13: 1.0280 (-44)

    Rserie ~1.0045 MΩ, Rtot ~5.217MΩ
    SEMJJOX5_10.zip versus JJoxv5_10-designs.zip
    Overlap areas for A=1060 x 310 nm2, B=830 x 260 nm2, C=645 x 250 nm2, C=485x 310 nm2.
    Ashing 3' @ 100W:

    4 probes Junction A (=top) Junction B Junction C Junction D (bottom)
    1-2 5-6: 1.0039 (-38) 3-4: 1.0039 (-38) 1-2: 1.0039 (-38) 16-15: 1.0039 (-38)
    3-4 7-8: 1.0039 (-38) 9-10: 1.0039 (-38) 11-12: 1.0039 (-38) 14-13: 1.0039 (-38)
    1-3 5-7: 1.0175 (-38) 3-9: 1.0248 (-38) 1-11: 1.0316 (-38) 16-14: 1.0334 (-38)
    1-4 5-8: " 3-10: " 1-12: " 16-13: "
    2-3 6-7: " 4-9: " 2-11: " 15-14: "
    2-4 6-8: " 4-10: " 2-12: " 15-13: "

    Shunt junction D on purpose by switching light on after measuring (with potar on "shunt" position, and probes layed down on junction D). This does not affect other junctions.
    Aging (or another ashing???? -> Simon: No ashing)

    4 probes Junction A (=top) Junction B Junction C Junction D (bottom)
    1-2 5-6: 1.0041 (-40) 3-4: 1.0039 (-39) 1-2: 1.0040 (-39) 16-15: 
    3-4 7-8: 1.0041 (-40) 9-10: 1.0039 (-39) 11-12: 1.0041 (-40) 14-13:
    1-3 5-7: 1.0200 (-40) 3-9: 1.0273 (-38) 1-11: 1.0352 (-39) 16-14:
    1-4 5-8: " 3-10: " 1-12: " 16-13: 
    2-3 6-7: " 4-9: " 2-11: " 15-14: 
    2-4 6-8: " 4-10: " 2-12: " 15-13: 

    Rserie ~ 1.0039 MΩ , Rtot ~5.218 MΩ

    Test wafer (03/12/2014)

    Wafer: 1-10 Ω*cm, 100 nm thermal Ox, thickness=(270+/-25) um, Lot N°=11/1023.

    Wafer preparation: clean in Acetone, then IPA, Hotplate for 3min at 120°C, Oxygen ashing at 100 W (0.2 mbar) for 3 min.

    - spin MAA8.5 EL10 (batch 14020103, exp. 3/1/2015) @ 2000rpm for 50"
    5" 500rpm 200rpm/s + 50" 2000rpm 1000rpm/s + 5" 6000rpm 4000rpm/s (edge removal)
    - bake hot plate setpoint 180°C, 5'
    - spin PMMA A6 (batch 14020103, exp. 3/1/2015) @ 6000rpm for 50" (same trick)
    - bake hot plate setpoint 180°C, 15'
    - UV III, (Quantronics batch, filled on the 02/2014 but expired on the 03/2005) @ 4000 rpm for
     50" 
    (same trick)
    - bake hot plate setpoint 140°C, 90 sec.

    Cutting into 5 x 5 mm2. Remove any dust by blowing N2. Samples are ordered in the sample-box as given by their location on the wafer.

    JJoxv5_11

    slightly modify design according to observations on _10

    exp: 30keV (03/12/2014)
    Note there is a big issue with XL30, the fast blanker seems polluted or misaligned. When one passes to current spot 7, the focus and stigma on spot 1 are completely out of range, and become impossible to get back properly. The only way to recover a working column is to vent. Trentin suspects a polluted blanker. 
    dev: 1', eth:IPA=1:1 for 1', IPA 1'. Looks fine under optical microscope.
    no Ashing
    evapion milling 2x10" 3mA 500V, Al 30nm 0° 1 nm/s, static oxydation 75mb 5 min, Al 0.6 nm 0° 0.1 nm/s (0.64nm at shutter close), static oxydation 75mb  5 min, Al 60 nm +35°.
    Lift-off: PG remover at 70°C for 1 hour. No US.
    Probe station (04/12/2014):

    4 probes Junction A (=top) Junction B Junction C Junction D (bottom)
    1-2 5-6: 1.0045 (-43) 3-4: 1.0041 (-410) 1-2: 1.0042 (-41) 16-15:
    3-4 7-8: 1.0045 (-43) 9-10: 1.0106 (-40) 11-12: open 14-13: 
    1-3 5-7: 1.0235 (-41) 3-9: 1.0287 (-40) 1-11: 1.0440 (-39) 16-14: shorted
    1-4 5-8: 1.0235 (-41) 3-10: 1.0351 (-40) 1-12: open 16-13: 
    2-3 6-7: 1.0235 (-41) 4-9: 1.0287 (-40) 2-11: 1.0441 (-40) 15-14: 
    2-4 6-8: 1.0235 (-41) 4-10: 1.0349 (-40) 2-12: open 15-13:

    Rserie ~1.0042 MΩ, Rtot ~5.212MΩ
    A: 1010x230nm2, B: 780x195nm2, C: 620x195nm2, D: 465x245nm2 (D is clearly shunted)
    SEMJJOX5_11.zip
    Ashing 3' @ 100W, 0.2 mbar O2.
    Probe station** (08/12/2014):

    4 probes Junction A (=top) Junction B Junction C Junction D (bottom)
    1-2 5-6: 1.0048 (-47) 3-4: 1.0048 (-47) 1-2: 1.0048 (-47) 16-15:
    3-4 7-8: 1.0048 (-47) 9-10: 1.0133 (-47) 11-12: open 14-13: 
    1-3 5-7: 1.0078 (-47) 3-9: 1.0430 (-50) 1-11: 1.0656 (-50) 16-14: 
    1-4 5-8: 1.0078 (-47) 3-10: 1.0512 (-50) 1-12: open 16-13: 
    2-3 6-7: 1.0078 (-47) 4-9: 1.0430 (-50) 2-11: 1.0658 (-51) 15-14: 
    2-4 6-8: 1.0078 (-47) 4-10: 1.0512 (-50) 2-12: open 15-13: 

    Rserie ~1.0048 MΩ, Rtot ~5.218MΩ

    JJoxv5_12

    After cleaning the XL30 fast blanker 45 minutes in the asher 200W, 200µb, mounting it back properly, I test that there is no more charging problem. But now we have to test that the litho is still working (is the blanker working?)

    Maybe the openings of the mask between the boxes on _8µ and _9 came from that blanker charging issue...

    exp: 30keV (04/12/2014)
    dev: 1', eth:IPA=1:1 for 1', IPA 1'. Looks fine under optical microscope.
    no Ashing
    evap: ion milling 2x10" 3mA 500V, Al 30nm 0° 1 nm/s, static oxydation 5mb 5 min, Al 0.6 nm 0° 0.1 nm/s (0.64nm at shutter close), static oxydation 5mb  5 min, Al 60 nm +35°.
    Lift-off: PG remover at 70°C for 1 hour. No US.
    Probe station (05/12/2014):

    4 probes Junction A (=top) Junction B Junction C Junction D (bottom)
    1-2 5-6: 1.0042 (-41) 3-4: 1.0042 (-41) 1-2: 1.0041 (-40) 16-15:1.0040 (-39)
    3-4 7-8: 1.0042 (-41) 9-10:1.0042 (-41) 11-12: 1.0041 (-40) 14-13: 1.0039 (-38)
    1-3 5-7: 1.0112 (-41) 3-9: 1.0140 (-40) 1-11:1.0330 (-40) 16-14: 1.0178 (-38)
    1-4 5-8: 1.0112 (-41) 3-10: 1.0141 (-41) 1-12: 1.0330 (-40) 16-13: 1.0178 (-38)
    2-3 6-7: 1.0112 (-41) 4-9: 1.0140 (-40) 2-11: 1.0330 (-40) 15-14: 1.0178 (-38)
    2-4 6-8: 1.0112 (-41) 4-10:1.0140 (-40) 2-12: 1.0329 (-39) 15-13:1.0178 (-38)

    Rserie ~MΩ, Rtot ~MΩ
    A: 1010x210nm2, B: 770x180nm2, C: 605x170nm2, D: 440x210nm2
    SEMJJOX5_12.zip
    Junction A & D have large chunk of resist residue near the overlap area, in addition the second angle is visible (not the case for Junction B & C). Junction B looks well. Juncion C has an additional junction in series of overlap 325 x 1060 nm2.

    Ashing 3' @ 100W, 0.2 mbar O2.
    Probe station** (08/12/2014):

    4 probes Junction A (=top) Junction B Junction C Junction D (bottom)
    1-2 5-6: 1.0051 (-50) 3-4: 1.0050(-49) 1-2: 1.0050(-49) 16-15:1.0050 (-49)
    3-4 7-8: 1.0051 (-50) 9-10:1.0050(-49) 11-12: 1.0050(-49) 14-13: 1.0050 (-49)
    1-3 5-7: shorted 3-9: shorted 1-11:1.0440(-49) 16-14: shorted
    1-4 5-8:  3-10:  1-12: 1.0440(-49) 16-13: 
    2-3 6-7:  4-9:  2-11: 1.0440(-49) 15-14: 
    2-4 6-8:  4-10:  2-12: 1.0440(-49) 15-13: 

    Rserie ~1.0048 MΩ, Rtot ~5.218MΩ

    Junction A,B & D got short circuited! Junction C has an increased Rn after Ashing.
    ** Someone else was using the bonding machine next to the probestation at the same time.

    GeTest1

    Idea: adding a layer of Ge between the two resists and using the Ge-layer as a solid mask.

    Wafer: 1-10 Ω*cm, 10 nm thermal Ox, thickness=(270+/-25) um, Lot N°=11/1023.

    Clean wafer with 7min Ox ashing at 100 W (0.2 mbar). Put on hotplate at 120°C for 5min and let it cool down for 2min.

    - spin MAA8.5 EL10 (batch 14020103, exp. 3/1/2015) @ 2000rpm for 50"
    5" 500rpm 200rpm/s + 50" 2000rpm 1000rpm/s + 5" 6000rpm 4000rpm/s (edge removal)
    - bake hot plate setpoint 180°C, 15'
    - evaporate Germanium at 0°, 50 nm, 0.2nm/s, p=5x10-7 mbar.
    - spin PMMA A6 (batch 14020103, exp. 3/1/2015) @ 6000rpm for 50" (same trick)
    - bake hot plate setpoint 150°C, 15'
    - UV III, (Quantronics batch, filled on the 02/2014 but expired on the 03/2005) 
    @ 4000 rpm for 50" (same trick)
    - bake hot plate setpoint 140°C, 90 sec.
    JJoxv5_13
    exp (08/12) 30keV, Spot1

    dev: 1', stop eth:IPA (1:1) 1'
    asher: 1', 100W, 200µb O2

    evap: vieux canon.
    Done simultaneously with BPC2v5_2 and 3
    Note 1: crucible just filled by Pief the week before. Note 2: Ar/O2 bottle almost empty.

    - ion mill 3mA 500V, 2x 10" @ 0° (both)
    - Ti pump ([email protected]/s) -> P_ch = 4e-8
    - Al 32nm @ 1nm/s, 0°, P_ev = 4e-7mb
    - ox 5'@ 100mb
    - Al 0.78nm @ 0.1nm/s, 0°
    - ox 5' @ 100mb
    - Ti pump -> P_ch = 8e-8
    - Al 60nm @ 1nm/s, P_ev = 4e-7mb

    lift PG remover 76°C, 1h
    Probe Station (08/12/2014):

    4 probes Junction A (=top) Junction B Junction C Junction D (bottom)
    1-2 5-6: 1.0049 (-48) 3-4: 1.0049 (-48) 1-2: 1.0049 (-48) 16-15: 1.0048 (-47)
    3-4 7-8: 1.0049 (-48) 9-10:1.0049 (-48) 11-12: 1.0049 (-48) 14-13: 1.0048 (-47)
    1-3 5-7: 1.0194 (-48) 3-9: 1.0252 (-48) 1-11: 1.0333 (-48) 16-14: 1.0333 (-47)
    1-4 5-8: 1.0194 (-48) 3-10: 1.0252 (-48) 1-12: 1.0333 (-48) 16-13: 1.0333 (-47)
    2-3 6-7: 1.0194 (-48) 4-9: 1.0252 (-48) 2-11: 1.0333 (-48) 15-14: 1.0333 (-47)
    2-4 6-8: 1.0194 (-48) 4-10:1.0252 (-48) 2-12: 1.0333 (-48) 15-13:1.0333 (-47)


    SEM: JJox5_13.zip
    Overlap areas for A=1010 x 250 nm2, B=800 x 205 nm2, C=600 x 200 nm2, C=450 x 265 nm2.
    asher 2' @ 100W, 200µb O2
    Probe Station (08/12/2014):

    4 probes Junction A (=top) Junction B Junction C Junction D (bottom)
    1-2 5-6: 1.0049 (-48) 3-4: 1.0048 (-47) 1-2: 1.0048 (-47) 16-15: 1.0047 (-46)
    3-4 7-8: 1.0049 (-48) 9-10:1.0048 (-47) 11-12: 1.0048 (-47) 14-13: 1.0047 (-46)
    1-3 5-7: 1.0210 (-48) 3-9: 1.0275 (-47) 1-11: 1.0367 (-46) 16-14: 1.0388 (-47)
    1-4 5-8: 1.0210 (-48) 3-10: 1.0275 (-47) 1-12: 1.0367 (-46) 16-13: 1.0388 (-47)
    2-3 6-7: 1.0210 (-48) 4-9: 1.0275 (-47) 2-11: 1.0367 (-46) 15-14: 1.0388 (-47)
    2-4 6-8: 1.0210 (-48) 4-10:1.0275 (-47) 2-12: 1.0367 (-46) 15-13:1.0388 (-47)
    JJoxv5_14
    exp (12/12) 30keV, Spot1

    dev: 1', stop eth:IPA (1:1) 1'

    The exp went wrong, something weird. Much longer than usual, as if the meander mode did not switch on. Current in spot 7 on chip between 1nA and 11nA, whereas usually it is more around 40nA...
    obs on microscope, lines are disconnected at some points, but chip is viable.

    asher: 1', 100W, 200µb O2
    evap (15/12) vieux canon
    Done simultaneously with BPC2v4_2

    - ion mill 3mA 500V, 2x 10" @ 0° (both)
    - Al 30nm @ 1nm/s, 0°, P_ev = 7e-7mb
    - ox 5'@ 800mb
    - Al 0.63-0.69nm @ 0.1nm/s, 0°
    - ox 5' @ 800mb
    - Ti pump -> P_ch = 2e-7
    - Al 60nm @ 1nm/s, P_ev = 4e-7mb

    lift PG remover 76°C, 1h
    asher 2' @ 100W, 200µb O2
    Probe Station (15/12/2014):

    4 probes Junction A (=top) Junction B Junction C Junction D (bottom)
    1-2 5-6:  1.0221 (-49) 3-4:  1-2:  16-15: 
    3-4 7-8: 1.00495 (-49) 9-10:  11-12:  14-13: 
    1-3 5-7: 1.1112 (-49) 3-9: shunted 1-11: shunted 16-14: shunted
    1-4 5-8: 1.1113 (-49) 3-10:  1-12:  16-13: 
    2-3 6-7: 1.0948 (-49) 4-9:  2-11:  15-14: 
    2-4 6-8: 1.0947 (-49) 4-10:  2-12:  15-13: 

    SEM: JJOX5_14.zip

    mardi 16/12

    I decide to switch to e-line to test this blanking hypothesis
    Requires quite some adjustements.
    Expose test sample with JJoxyv5 patterns. JJox5_15

    Exp: 30keV, 300µC/cm2. aperture 30µm for fine patterns (~360pA), aperture 120µm for large patterns (~1.5nA?)
    Dev: 1' MIBK:IPA, 30" eth:IPA, 30" IPA
    Evap: 30nm @ 0° / 60nm @ 35° (no oxidation)
    SEM: JJox5_15.zip

    Note that I could not align properly the small fields and the large ones because I did not have the procedure to recall shifts from database properly. Now it is implemented.

    The patterns are really underdosed compared to same patterns on XL30. Viven noticed the same. Maybe about 10% difference or so.

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