datasheets on: microchemicals(Login: microc ; password: yoursheets)
photo sensitive - positive or negative resist (can be crosslinked)
εr=
λ/2n= nm
solvent: AZ1500 or EBR
Dilution and edge bead removal | AZ EBR Solvent |
Prebake | 110°C, 50" - 1', hotplate |
Exposure | broadband or monochromatic h- and i-line. Starting point: 50 mJ/cm² (critical step) |
Reversal bake | 120°C, 2 min., hotplate (most critical step) |
Flood exposure | > 200 mJ/cm² (uncritical) |
Development | AZ 351B, 1:4 (tank, spray) or AZ MIF 726 (puddle) or AZ 400K, 1:4 |
Postbake | 120°C, 50s hotplate (optional) |
Removal | AZ 100 Remover, or Aceton then IPA |
primer: Microposit
spin 5” @ 1000rpm (rise time 10”)
spin ~30” @ 6000rpm (rise time 5”) ~10 nm layer
resist: AZ52xx
dispense 3 mL for 3 inches wafer
Dispense at constant rate in the center of the wafer, and do not empty the container to avoid bubbles.
spin 1000 rpm 3” (rise time 10”) to spread the resist over the wafer
spin 60” for a uniform coat (rise time ~2”)
spin speed (rpm) | 2000 | 3000 | 4000 | 5000 | 6000 |
AZ 5214E | 1980 | 1620 | 1400 | 1250 | 1140 |
AZ 5206 | 600 | 450 |
Typically varies as the inverse square root of spin speed.
Hot plate 45’’ - 1' @ 100 °C
Wafer must be cooled down before exposure.
DNQ-based resists (= almost all AZ®positive and image reversal resist) require a certain water content during exposure in order to subsequently attain a high development rate. A high development rate is a requirement for a high contrast. The rehydration time to attain an equilibrium water concentration in the resist is diffusion-limited and increases quadratically with the film thickness: Thin (< 2 μm) resist films only need seconds for this process steps which makes an extra delay redundant.
standard parameters 50 mJ/cm2 (/1.5µm)
for fine resolution 30 mJ/cm2 (/1.5µm)
This should be integrated over the whole spectrum of the mask aligner, weighted by the resist sensitivity
Note the resist becomes transparent when exposed (right figure)
standard parameters 2’ @120ºC (setpoint 125°C in SPEC / LPN cleanroom hotplates)
Check the hotplate temperature with a thermometer.
To be increased if lowering the first exposure dose.
> 200 mJ/cm 2/µm (~ 20’’ au MJB4 )
developer: AZ531B or AZ 400K or MIF 726
Development at ambient temperature in diluted developer: ODI + AZ351B (4:1)
base de temps pour le MIF 726: 30’’
Procedure for first determination of development time: perform a flood exposure and develop. The film thins in the developper, which provokes visible interference patterns and irisations. When these patterns dissapear, this determines the development time.
Add 10% over-developping for positive process,
Add 30% for negative process in order to get a good undercut (as the undercut developps after the pattern is completely dissolved)
Rinse: ODI
to stop development, under water tap ~1’-2’
Fichier | Taille | Date | Attaché par | |||
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az_5214e.pdf AZ5214E datasheet | 75.36 Ko | 16:40, 22 Jun 2011 | Admin | Actions | ||
image_reversal_resists.pdf Aucune description | 188.32 Ko | 17:25, 7 Jan 2014 | Helene_Le_Sueur | Actions | ||
lithography_trouble_shooting.pdf Aucune description | 111.18 Ko | 17:25, 7 Jan 2014 | Helene_Le_Sueur | Actions | ||
msds_AZ5214.pdf safety datasheet | 93.58 Ko | 10:49, 10 Mar 2015 | Helene_Le_Sueur | Actions |
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